What KPIs and Analytics Does a Semiconductor Manufacturer Use?
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Yield Rate: Yield rate measures the percentage of good, usable chips produced compared to the total number of chips manufactured. It's a crucial indicator of production efficiency and quality control.
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Defect Density: Defect density quantifies the number of defects or faults per unit area of semiconductor wafer. Lower defect densities indicate higher product quality.
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Throughput and Cycle Time: Throughput measures the number of wafers processed per unit of time, while cycle time refers to the time taken to complete a specific manufacturing step. Both KPIs are critical for optimizing production efficiency.
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Equipment Utilization and OEE (Overall Equipment Effectiveness): Equipment utilization calculates the percentage of time that manufacturing equipment is actively used. OEE combines availability, performance, and quality to assess the overall efficiency of equipment.
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Scrap and Rework Rates: Scrap rate measures the percentage of defective or unusable chips in a production batch. Rework rate quantifies the percentage of chips that need to be reprocessed due to defects.
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Process Capability Indices (Cpk): Process capability indices evaluate the capability of a manufacturing process to produce products within specified tolerance limits. Higher Cpk values indicate more precise and controlled processes.
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First Pass Yield (FPY): FPY calculates the percentage of units that pass through the entire manufacturing process without requiring rework or being scrapped. It's a critical metric for assessing production efficiency and cost-effectiveness.
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Mean Time Between Failures (MTBF) and Mean Time to Repair (MTTR): MTBF measures the average time between equipment failures, while MTTR quantifies the average time taken to repair equipment. These metrics are crucial for maintaining equipment reliability and minimizing downtime.
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Inventory Turns: Inventory turns assess how efficiently raw materials and finished goods are utilized in the manufacturing process. Higher turns indicate better inventory management.
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Wafer Fab Utilization: This KPI evaluates the percentage of time that the wafer fabrication facility is in use. It helps optimize resource allocation and capacity planning.
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Cost per Wafer and Cost per Die: These metrics assess the cost-effectiveness of the manufacturing process by evaluating the expenses associated with producing each wafer and individual die.
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Customer Return Rate: This KPI measures the percentage of products returned by customers due to defects or quality issues. It provides valuable feedback on product quality and customer satisfaction.
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